Description
Nikon S Plan Fluor ELWD 40x0.60 Ph2 ADM ∞/0-2 WD 3.6-2.8 Objective
Used, in good optical condition.
PRODUCT IDENTIFICATION
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Model: CFI S Plan Fluor ELWD ADM 40XC
Material / Part Number: MRH48430
Manufacturer: Nikon
Class / Series: CFI60 Infinite Optical System
KEY SPECIFICATIONS
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Magnification: 40X
Numerical Aperture (NA): 0.60
Working Distance (WD): 3.6 – 2.8 mm (Adjustable via Correction Collar)
Cover Glass / Vessel: 0 – 2.0 mm (Correction Ring Range)
Immersion Medium: Air (Dry)
Primary Technique: Apodized Phase Contrast (ADM)
Objective Type: Super Plan Fluor (Semi-Apochromat)
OPTICAL & DESIGN FEATURES
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1. Super Plan Fluor Optical Class:
- Exceptionally high optical transmission from UV to Near-Infrared (NIR) spectrum.
- Ultra-low autofluorescence background, ideal for high-sensitivity fluorescence.
- Excellent field flatness across the entire field of view (FOV).
2. Apodized Phase Contrast (ADM):
- Employs an advanced apodized phase ring design with an absorption gradient.
- Significantly suppresses the optical "halo effect" inherent to standard phase contrast.
- Delivers enhanced visual clarity, sharper edge resolution, and superior contrast
for cell boundaries and internal organelle microstructures.
3. Extra Long Working Distance (ELWD) & Correction Collar (0–2.0 mm):
- Long clearance (2.8–3.6 mm) allows seamless focus through plastic culture vessels,
multi-well microplates (24/96-well), and Petri dishes.
- Built-in precision correction collar actively compensates for spherical aberration
caused by varied bottom thicknesses (0 mm to 2.0 mm).
TYPICAL APPLICATIONS
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- Unstained Live Cell Observation & Morphological Screening
- Microplate & Dish-Based Cell Culture Inspection
- Combined Apodized Phase Contrast and Multi-Color Fluorescence Imaging
- Thick Specimen & Tissue Culture Studies
